Data-feedthrough faults in circuits using unclocked storage elements - Electronics Letters
نویسندگان
چکیده
Some faults in storage elements (SEs) do not manifest as stuck-at0/1 faults. These include data-feedthrough faults that cause the SE cell to exhibit combinational behaviour. The authors investigate the implications of such faults on the behaviour of circuits using unclocked SEs. It is shown that effects of data-feedthrough faults at the behavioural level are different from those due to stuck-at faults, and therefore tests generated for the latter may be inadequate.
منابع مشابه
Faulty behavior of storage elements and its effects on sequential circuits - Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
It is often assumed that the faults in storage elements (SE’s) can be modeled as output/input stuck-at-faults of the element. They are implicitly considered equivalent to the stuck-at faults in the combinational logic surrounding the SE cells. Transistor-level faults in common SE’s are examined here. A more accurate higher level fault model for elementary SE’s is presented that better represent...
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